featured products

• ICOS WI-2250 –Automated optical inspection and metrology of microelectronic devices on a variety of wafer substrates, surface defect inspection, and 2D bump inspection for the semiconductor IC, optoelectronics, advanced packaging, and MEMS markets.
• 8900 - High speed patterned-wafer defect inspection system suitable for detecting a wide variety of defects in the sub-micron to five-micron range, for image-sensor development and production as well as other applications
• Teron 600 - Reticle defect inspection platform with the sensitivity, flexibility and computational lithography power to enable development and manufacturing of reticles to support the wide variety of 2Xnm lithography schemes
• 2830 Series - Brightfield inspection platform with PowerBroadband™, a revolutionary high-brightness light source that enables more repeatable capture of difficult defects for accelerated ramp of leading-edge devices.
  

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